Tag: SEM
SEM
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CIQTEK DB500 Focused Ion Beam FESEM Microscope
Add to cart• Electron Beam System
Gun type: High brightness Schottky Plus Field Emission Electron Gun
Resolution: 1.2 nm@15 kV
Acceleration Voltage 20 V ~ 30 kV
• Ion Beam System
Gun type: Liquid gallium ion source Resolution: 3 nm@30 kV
Acceleration Voltage 500 V ~ 30 kV
• Camera: Triple Optical navigation + sample chamber monitoring x2.
• Stage Type: Eucentric stage
• Stage Range: X=110 mm Y=110 mm / T: -10° ~+70°, Z=65 mm R: 360° -
CIQTEK SEM5000X FESEM Microscope
Add to cart• Resolution: 0.6 nm @ 15 kV, SE / 1.0 nm @ 1 kV, SE
• Acceleration Voltage 0.02kV ~ 30 kV
• Magnification 1 ~ 2,500,000 x
• Electron Gun Type: Schottky Field Emission Electron Gun
• Cameras: Optical navigation + Chamber monitor
• Stage Type: 5-Axis Mechanical Eu centric
• Stage Range: X=110 mm, Y=110 mm, Z=65 mm, T: -10*~+70°, R: 360°