Tag: wafer testing
wafer testing
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HPB-6
Add to cart- Handle devices up to 1000 watts
- 16 independent burn-in board slots
- 64M standard and 128M optional parallel vector depth –subroutine capable
- 8G scan vector depth
- 128 formatted vector I/O channels plus 128 vector output-only channels
- 8 programmable high-frequency clocks, up to 350 MHz – LVDS to the BiB