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Tag: wafer testing

wafer testing

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  • HPB-6

    • Handle devices up to 1000 watts
    • 16 independent burn-in board slots
    • 64M standard and 128M optional parallel vector depth –subroutine capable
    • 8G scan vector depth
    • 128 formatted vector I/O channels plus 128 vector output-only channels
    • 8 programmable high-frequency clocks, up to 350 MHz – LVDS to the BiB
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